Semiconductor Engineering

Shift Left Strategy For Semiconductor Production Testing

In the fast-paced world of semiconductor manufacturing, achieving higher yields and reducing costs are constant challenges. Ideally, yield should only be impacted by unavoidable defects when ...
Semiconductor Engineering

What’s WAT? Testing At The End Of Manufacturing

The high costs of building, resourcing and operating a foundry fabricating integrated circuits are well known. Fabless companies avoid this capital cost and focus on design and innovation in their ...
Business Wire

Hprobe Announces New Generation of Magnetic Test Head for Wafer Sort of MRAM in Mass Production

GRENOBLE, France--(BUSINESS WIRE)--Hprobe, a provider of turnkey semiconductor Automatic Test Equipment (ATE) for magnetic devices, today announced a breakthrough magnetic test head revolutionizing ...
Electronic Design

Reducing Logic Device Test Costs

Test-flow partitioning between wafer sort and final package test can have a dramatic impact on the cost of test. In some cases, the migration of package tests can be done over time, but the test ...
EDN

Intel’s ‘causal learning algorithm’ to reduce IC test costs

SANTA CLARA, Calif. — Looking to reduce the soaring costs of IC test, Intel Corp. hopes to leverage its “causal learning algorithm” technology for wafer sorting applications in the fab. Intel is ...
Digi Times

ADLINK high-efficiency die sorting machine solution increases effectiveness of IC packaging and testing

The back-end semiconductor manufacturing process refers to the IC packaging and testing that people often hear about. Specifically, the process known as chip probing (CP) is conducted to test the ...
NBC News

Aehr Test Systems Receives $2 Million in FOX(TM) Orders

FREMONT, Calif., May 19, 2011 (GLOBE NEWSWIRE) -- Aehr Test Systems (Nasdaq:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, announced today that it has received over $2 ...