Si2, IEEE, and IEEE EDS are sponsoring the second edition of the International Compact Modeling Conference (ICMC). Paper ...
This study presents a newly engineered nonlinear stiffness-softening mechanism that enables micro-electro-mechanical systems (MEMS) accelerometers to operate with dramatically reduced bias force and ...
The new toolkit integrates with Keysight’s device modeling software to automate parameter extraction and shorten compact-model and PDK development cycles. Keysight Technologies has introduced a ...
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